BINA hosted a Focused-Ion Beam (FIB) workshop, organized by the Graduate Student Division of the Israel Chemistry Society, attendedby students from universities around the country, studying for advanced degrees in chemistry.
The Graduate Student Division (GSD) of the Israel Chemistry Society (ICS) is a volunteer-based organization managed by a committee of chemistry students - one student from each university in Israel. The organization provides information about available scholarships, organizes conferences and seminars, and posts job openings in academia and in the industry - suitable for university graduates.
As part of its ongoing activities, the GSD recently instituted an annual workshop event, aimed at providing chemistry students with early exposure and training on diverse, cutting-edge instrumentation. Notably, the initiative also benefits the universities, by potentially attracting qualitative students as future researchers in the various faculties.
BINA hosts first GSD workshop
The first GSD workshop was held in September 2016 at the BINA center, and was organized by Ms. Gila Levi Benchetrit – a PhD student in chemistry at BIU, elected as BIU’s representative, who researches chiral inorganic nano-structures at the lab of Prof. Yitzhak Mastai.
“The workshop was attended by 20 students - all studying for advanced degrees in chemistry at various universities in Israel”, said Levi. “The first part included a lecture on FIB technologies for microscopy and nano-fabrication - delivered by Dr. Yafit Fleger, head of the FIB unit at BINA”, she said. In her lecture Dr. Fleger highlighted the benefits of the FIB microscope for analysis, imaging, and fabrication, and specifically its ability to provide high resolution imaging. She pointed out the main advantage of the HIM (Helium-Ion microscope) FIB - one of two types of FIB devices - in that it enables the imaging of nonconductive samples. Possible applications of the FIB in physics, chemistry, materials science, and life sciences were also discussed.
The lecture was followed by a tour and a training session on the two FIB devices, including a demonstration of fabricating thin membranes for the analysis of crystal defects, as well as slicing and analyzing nanoscale layers. Dr. Katya Gotlib-Vainshtein who worked in the Microscopy unit at BINA, explained and demonstrated on the HIM-FIB - the more advanced device.
“The workshop received very positive feedback, particularly the hands-on presentations which were highly professional”, Levi commented. “The workshop was delivered in English to accommodate several foreign students who attended. The intention is to organize this type of workshop three times a year, each at a different university”, she said.
Originally published in Institute for Nanotechnology and Advanced Materials' April 2017 newsletter